Atomic force microscopy studies of SrTiO3(001) substrates treated by chemical etching and annealing in oxygen

Science in China, Series G: Physics Astronomy

Volumn 48, Issue 4, 2005, Pages 459-468

  Wang, Xu ^a   Fei, Yiyan ^a   Lu, Huibin ^a   Jin, Kuijuan ^a   Zhu, Xiangdong ^a,b   Chen, Zhenghao ^a   Zhou, Yueliang ^a   Yang, Guozhen ^a  

^a INSTITUTE OF PHYSICS   (China)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

AFM; SrTiO3; Surface defects; Surface morphology

Indexed keywords

EID: 33644658503     PISSN: 16721799     EISSN: None     Source Type: Journal    
DOI: 10.1360/04yw0181     Document Type: Article

References (13)

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