Research on the key techniques of reliable microprocessor designs

Huazhong Keji Daxue Xuebao (Ziran Kexue Ban)/Journal of Huazhong University of Science and Technology (Natural Science Edition)

Volumn 33, Issue SUPPL., 2005, Pages 111-113

  Chen, Wei ^a   Dai, Kui ^a   Liu, Fang ^a  

^a NATIONAL UNIVERSITY OF DEFENSE TECHNOLOGY   (China)

Author keywords

Control flow check; Error detection and correction code; Fault tolerance; Single event upset; Triple module redundancy

Indexed keywords

CODES (SYMBOLS); COSTS; ERROR DETECTION; FAILURE ANALYSIS; FIELD PROGRAMMABLE GATE ARRAYS; FLOW CONTROL; PERFORMANCE; REDUNDANCY; RELIABILITY; STRUCTURAL DESIGN;

CONTROL FLOW CHECK; FAULT TOLERANCE; SINGLE EVENT UPSET; TRIPLE MODULE REDUNDANCY;

MICROPROCESSOR CHIPS;

EID: 33644637028     PISSN: 16714512     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (2)

1. Benso A, Carlo S D, Natale G D, et al. Control-flow checking via regular expressions [J]. IEEE Asian Test Symposium (ATS 2001), 2001, 1: 299-303
2. Nahmsuk O, Shirvani P P, McCluskey E J. Control flow checking by software signatures[J]. IEEE Transactions on Reliability Special Section on Fault Tolerant VLSI Systems, 2002, 51(1): 111-122