Interfaces under focus

Nature Materials

Volumn 5, Issue 3, 2006, Pages 173-174

  Urban, Knut ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC EQUIPMENT; ELECTROSTATIC DEVICES; HETEROJUNCTIONS; MATHEMATICAL MODELS; MICROSCOPIC EXAMINATION; MICROSTRUCTURE; SEMICONDUCTOR DEVICES;

ATOMIC SCALE ANALYSIS; ATOMIC SCALE TAILORING; ELECTROSTATIC MODEL; NEUTRAL LAYERS;

PEROVSKITE;

EID: 33644635754     PISSN: 14761122     EISSN: 14764660     Source Type: Journal    
DOI: 10.1038/nmat1589     Document Type: Short Survey

References (3)

1. Nakagawa, N., Hwang, H. Y. & Muller, D. A. Nature Mater. 5, 204-209 (2006).
2. Ohtomo, A. & Hwang, H. Y. Nature 427, 423-426 (2004).
3. Szot, K., Speier, W., Carius, R., Zastrow, U. & Beytr, W. Phys Rev. Lett. 88, 075508 (2002).