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Volumn 5991, Issue , 2005, Pages

Complete characterization of damage threshold in titanium doped sapphire crystals with nanosecond, picosecond and femtosecond laser pulses

Author keywords

Deterministic; Femtosecond; Nanosecond; Picosecond; Sapphire; Threshold; Titanium

Indexed keywords

DETERMINISTIC; FEMTOSECOND; NANOSECOND; PICOSECOND; THRESHOLD;

EID: 33644597574     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.638769     Document Type: Conference Paper
Times cited : (24)

References (7)
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  • 2
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    • Design and characterization of near-diffraction-limited femtosecond 100-TW 10-Hz high-intensity laser system
    • M. Pittman, S. Ferre, J.-P. Rousseau, L. Notebaert, J.-P. Chambaret, and G. Cheriaux, Design and characterization of near-diffraction-limited femtosecond 100-TW 10-Hz high-intensity laser system, Appl. Phys. B 74, 529 (2002)
    • (2002) Appl. Phys. B , vol.74 , pp. 529
    • Pittman, M.1    Ferre, S.2    Rousseau, J.-P.3    Notebaert, L.4    Chambaret, J.-P.5    Cheriaux, G.6
  • 4
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    • Statistical analysis of beam smoothing and some applications
    • J. Gamier, L. Videau, C. Gouédard et A. Migus, Statistical analysis of beam smoothing and some applications, J. Opt. Soc. Am. A 14 (1997), pp. 1928-1937
    • (1997) J. Opt. Soc. Am. A , vol.14 , pp. 1928-1937
    • Gamier, J.1    Videau, L.2    Gouédard, C.3    Migus, A.4
  • 6
    • 1942493110 scopus 로고    scopus 로고
    • Localized pulsed laser interaction with sub-micronic gold particles embedded in silica : A method for investigating laser damage initiation
    • J.Y. Natoli, L. Gallais, B. Bertussi, A. During, M. Commandré, J.L. Rullier, F. Bonneau and P. Combis, Localized pulsed laser interaction with sub-micronic gold particles embedded in silica : a method for investigating laser damage initiation, Optics Express, vol. 11, no 7, p. 824-827, 2003.
    • (2003) Optics Express , vol.11 , Issue.7 , pp. 824-827
    • Natoli, J.Y.1    Gallais, L.2    Bertussi, B.3    During, A.4    Commandré, M.5    Rullier, J.L.6    Bonneau, F.7    Combis, P.8
  • 7
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    • Integrated photothermal microscope and laser damage test facility for in-situ investigation of nanodefect induced damage
    • A. During, M. Commandré, C. Fossati, B. Bertussi, J.Y. Natoli, J.L. Rullier, H. Bercegol and B. Bouchut, Integrated photothermal microscope and laser damage test facility for in-situ investigation of nanodefect induced damage, Optics Express Vol.11, pp. 2497-2501, 2003.
    • (2003) Optics Express , vol.11 , pp. 2497-2501
    • During, A.1    Commandré, M.2    Fossati, C.3    Bertussi, B.4    Natoli, J.Y.5    Rullier, J.L.6    Bercegol, H.7    Bouchut, B.8


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.