The importance of ultra-high voltage electron microscopy in materials science

Proceedings of the Japan Academy Series B: Physical and Biological Sciences

Volumn 81, Issue 6, 2005, Pages 141-155

  Fujita, Hiroshi ^a,b  

^a OSAKA UNIVERSITY   (Japan)

^b NONE   (Japan)

Author keywords

Amorphization; Electron channeling; Foreign atom implantation; in situ observation; Objective aperture effect; Simultaneous reflection

Indexed keywords

EID: 33644595785     PISSN: 03862208     EISSN: 03862208     Source Type: Journal    
DOI: 10.2183/pjab.81.141     Document Type: Review

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