Development of a remote operation system for an ultra-high-voltage electron microscope

Journal of Electron Microscopy

Volumn 48, Issue 6, 1999, Pages 865-872

  Yoshida, Kiyokazu ^a   Takaoka, Akio ^a   Hayashi, Soichiro ^b   Matsui, Isao ^b  

^a OSAKA UNIVERSITY   (Japan)

^b HITACHI LTD   (Japan)

Author keywords

Communication link; Remote operation; UHVEM

Indexed keywords

ELECTRON MICROSCOPES; ELECTRON MICROSCOPY; LUMINANCE;

BRIGHTNESS CONTROL; HIGH VOLTAGE ELECTRON MICROSCOPE; MAGNIFICATION CONTROL; OBJECTIVE LENS; OPERATION SYSTEM; REAL-TIME OPERATION; REMOTE OPERATION; STAGE CONTROL; ULTRA HIGH VOLTAGE; ULTRA-HIGH-VOLTAGE ELECTRON MICROSCOPE;

ELECTRONS;

EID: 0033492324     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/oxfordjournals.jmicro.a023758     Document Type: Conference Paper

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