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Volumn 231, Issue 1-4, 2005, Pages 524-529

Hydrogen depth profiling by p-p scattering in nominally anhydrous minerals

Author keywords

Anhydrous minerals; Depth profiling; Hydrogen analysis; P p scattering

Indexed keywords

CONTAMINATION; MINERALOGY; NUCLEAR PHYSICS; PROTONS; SCATTERING; SURFACE PHENOMENA;

EID: 33644531285     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2005.01.111     Document Type: Conference Paper
Times cited : (19)

References (16)
  • 14
    • 33644533735 scopus 로고    scopus 로고
    • Sparrow Corporation. Available from: < http://www.sparrowcorp.com gt;


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.