Characterization of the grain size in ferromagnetic colloids: Comparing torsional-pendulum measurements with standard complementary methods

Zeitschrift fur Physikalische Chemie

Volumn 220, Issue 2, 2006, Pages 153-171

  Embs, J ^a   Muller H W ^b   Krill III, C E ^a   Meyer, F ^a   Natter, H ^a   Muller B ^b   Wiegand, S ^b   Lucke M ^a   Knorr, K ^a   Hempelmann, R ^a  

^a SAARLAND UNIVERSITY   (Germany)

^b MAX PLANCK INSTITUTE FOR POLYMER RESEARCH   (Germany)

Author keywords

Ferrofluids; Particle Size Analysis; Relaxation Time

Indexed keywords

FERROELECTRIC MATERIALS; FERROMAGNETIC MATERIALS; FERROMAGNETISM; MAGNETIC FLUIDS; MAGNETITE; PARTICLE SIZE ANALYSIS; PENDULUMS; PHOTON CORRELATION SPECTROSCOPY; RELAXATION TIME; SHEAR FLOW;

COMPLEMENTARY METHODS; COMPLEMENTARY TECHNIQUES; FERROMAGNETIC GRAIN; HYDRODYNAMIC DIAMETER; ROTATIONAL VISCOSITY; SITU CONDITIONS; SURFACTANT COATING; TORSIONAL PENDULUM;

PARTICLE SIZE;

EID: 33644529439     PISSN: 09429352     EISSN: None     Source Type: Journal    
DOI: 10.1524/zpch.2006.220.2.153     Document Type: Conference Paper

References (27)

1. For an introduction see: R. E. Rosensweig, Ferrohydrodynamics. Cambridge University Press, Cambridge, England (1985).
2. J. P. McTague, J. Chem. Phys. 51 (1969) 133.
3. M. I. Shliomis, Sov. Phys. JETP 34 (1972) 1291.
4. M. I. Shliomis and K. I. Morozov, Phys. Fluids 6 (1994) 2855.
5. J. C. Bacri, R. Perzynski, M. I. Shliomis, and G. I. Burde, Phys. Rev. Lett. 75 (1995) 2128.
6. A. Zeuner, R. Richter, and I. Rehberg, Phys. Rev. E 58 (1998) 6287.
7. F. Gazeau, B. M. Heegaard, J. C. Bacri, A. Cebers, and R. Perzynski, Europhys. Lett. 35 (1996) 609;
8. F. Gazeau, C. Baravian, J. C. Bacri, R. Perzynski, and M. I. Shliomis, Phys. Rev. E 56 (1997) 614.
9. J. Bläsing, G. Strassburger, and D. Eberbeck, Phys. Stat. Sol. (a) 146 (1994) 595.
10. J. C. Bacri, R. Perzynski, D. Salin, and J. Servais, J. Phys. 48 (1987) 1385 and references cited therein.
11. J. P. Embs, H. W. Müller, C. Wagner, K. Knorr, and M. Lücke, Phys. Rev. E 61 (2000) R2196.
12. B. Huke and M. Lücke, Phys. Rev. E 62 (2000) 6875.
13. J. D. Jackson, Klassische Elektrodynamik. de Gruyter, Berlin (1982), Chapt. 4.
14. T. Weser and K. Stierstadt, Z. Phys. B 59 (1985) 257.
15. H. P. Klug and L. E. Alexander, X-Ray Diffraction Procedures for Polycrystalline and Amorphous Materials, 2nd ed. Wiley, New York (1974), Chapt. 9.
16. B. E. Warren and B. L. Averbach, J. Appl. Phys. 21 (1950) 595;
17. J. Appl. Phys. 23 (1952) 497.
18. B. E. Warren, X-Ray Diffraction. Dover, New York (1990), Chapt. 13.
19. C. E. Krill and R. Birringer, Philos. Mag. A 77 (1998) 621.
20. H. Natter, M. Schmelzer, M. S. Löffler, C. E. Krill, A. Fitch, and R. Hempelmann, J. Phys. Chem. B 104 (2000) 2467.
21. C. E. Krill, R. Haberkorn, and R. Birringer, in Handbook of Nanostructured Materials and Nanotechnology, Vol. 2: Spectroscopy and Theory, H. S. Nalwa (Ed.). Academic Press, London (2000), Chapt. 3.
22. S. J. Provencher, Comp. Phys. Comm. 27 (1982) 213;
23. Comp. Phys. Comm. 27 (1982) 229.
24. H. W. Müller and M. Liu, Phys. Rev. E 64 (2001) 061405.
25. M. A. Martsenyuk, Y. L. Raikher, and M. I. Shliomis, Sov. Phys. JETP 38 (1974) 413.
26. J. T. Waldron, Y. P. Kalmykov, and W. T. Coffey, Phys. Rev. E 49 (1994) 3976.
27. M. Shliomis, Sov. Phys.-Usp. 17 (1974) 153.