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Volumn 231, Issue 1-4, 2005, Pages 440-445

Elemental depth profiling in Cu(In, Ga)Se2 solar cells using micro-PIXE on a bevelled section

Author keywords

Bevelled section; CIGS thin films; Elemental depth profiling; Flexible solar cells

Indexed keywords

COPPER COMPOUNDS; DEPOSITION; FILM GROWTH; ION BEAMS; MASS SPECTROMETRY; THIN FILMS;

BEVELLED SECTION; CIGS THIN FILMS; ELEMENTAL DEPTH PROFILING; FLEXIBLE SOLAR CELLS;

SOLAR CELLS;

EID: 33644522747 PISSN: 0168583X EISSN: None Source Type: Journal
DOI: 10.1016/j.nimb.2005.01.097 Document Type: Conference Paper

Times cited : (9)

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