Ion-beam analysis of CuInSe2 solar cells deposited on polyimide foil

Analytical and Bioanalytical Chemistry

Volumn 379, Issue 4, 2004, Pages 622-627

  Spemann, D ^a   Lorenz, M ^a   Butz, T ^a   Otte, K ^b  

^a UNIVERSITY OF LEIPZIG   (Germany)

^b Solarion GmbH   (Germany)

Author keywords

Beveled section; CIS thin films; Elemental depth profiling; Flexible solar cells

Indexed keywords

COPPER COMPOUNDS; DEPOSITION; ION BEAMS; POLYIMIDES; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SECONDARY ION MASS SPECTROMETRY; THIN FILMS; X RAY ANALYSIS;

BEVELED SECTION; CIS THIN FILMS; ELEMENTAL DEPTH PROFILING; FLEXIBLE SOLAR CELLS;

SOLAR CELLS;

ALLOY; COPPER; INDIUM; ION; POLYIMIDE RESIN; RESIN; SELENIUM;

ARTICLE; CHEMISTRY; MASS SPECTROMETRY; MATERIALS TESTING; METHODOLOGY; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR; SPECTROMETRY; SURFACE PROPERTY;

ALLOYS; COPPER; INDIUM; IONS; MASS SPECTROMETRY; MATERIALS TESTING; MICROSCOPY, ELECTRON, SCANNING; RESINS, SYNTHETIC; SELENIUM; SEMICONDUCTORS; SPECTROMETRY, X-RAY EMISSION; SURFACE PROPERTIES;

EID: 21144450682     PISSN: 16182642     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00216-004-2657-3     Document Type: Conference Paper

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