Structures and morphologies of cast and plastically strained polyamide 6 films as evidenced by confocal Raman microspectroscopy and atomic force microscopy

Polymer

Volumn 45, Issue 17, 2004, Pages 6013-6026

  Ferreiro, Vincent ^a   Depecker, Christophe ^a   Laureyns, Jacky ^b   Coulon, Ghislaine ^a  

^a UNIV LILLE   (France)

^b UNIVERSITÉ DES SCIENCES ET TECHNOLOGIES DE LILLE   (France)

Author keywords

Atomic force microscopy; Raman microspectroscopy; Semicrystalline polymers

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL STRUCTURE; MORPHOLOGY; PLASTIC DEFORMATION; PLASTIC FILMS; RAMAN SPECTROSCOPY;

CONFOCAL RAMAN MICROSPECTROSCOPY; FIBRILS; SHEAR BANDING;

POLYAMIDES;

PLASTIC; POLYAMIDE; POLYMER;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL STRUCTURE; CRYSTAL STRUCTURE; EVOLUTION; FIBER; FILM; MORPHOLOGICAL TRAIT; RAMAN SPECTROMETRY; TEMPERATURE;

POLYMER SCIENCE;

EID: 3343024653     PISSN: 00323861     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.polymer.2004.06.018     Document Type: Article

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