Characterising the dynamics of individual embedded dislocation structures

Scripta Materialia

Volumn 51, Issue 8 SPEC. ISS., 2004, Pages 783-788

  Poulsen, H F ^a   Bowen, J R ^a   Gundlach, C ^a  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

3DXRD; Nucleation; Recovery; Synchrotron radiation; X ray diffraction

Indexed keywords

ANNEALING; CRYSTAL ORIENTATION; DEFORMATION; DISLOCATIONS (CRYSTALS); ELECTRON MICROSCOPY; GRAIN BOUNDARIES; NUCLEATION; PHASE TRANSITIONS; STRUCTURAL ANALYSIS; SYNCHROTRON RADIATION; X RAY DIFFRACTION ANALYSIS;

3DXRD; DISLOCATION STRUCTURES; X-RAY DIFFRACTION (XRD);

MICROSTRUCTURE;

EID: 3342964370     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2004.06.024     Document Type: Article

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