3D-characterisation of microstructure evolution during annealing of a deformed aluminum single crystal

Acta Materialia

Volumn 51, Issue 9, 2003, Pages 2517-2529

  Poulsen, H F ^a   Lauridsen, E M ^a   Schmidt, S ^a   Margulies, L ^a,b   Driver, J H ^c  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^c ECOLE DES MINES DE SAINT ETIENNE   (France)

Author keywords

Aluminium; Recovery; Recrystallisation; Texture; X ray diffraction

Indexed keywords

ALUMINUM; ANNEALING; DEFORMATION; METALLOGRAPHIC MICROSTRUCTURE; RECRYSTALLIZATION (METALLURGY); TEXTURES; X RAY DIFFRACTION ANALYSIS;

DISLOCATION BOUNDARIES;

SINGLE CRYSTALS;

EID: 0038036627     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6454(03)00048-X     Document Type: Article

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