메뉴 건너뛰기




Volumn 106, Issue 4-5, 2006, Pages 423-431

Quantitative Fresnel Lorentz microscopy and the transport of intensity equation

Author keywords

Lorentz microscopy; Magnetic domain walls; Magnetic domains; Magnetic thin films; Transmission electron microscopy; Transport of intensity equation

Indexed keywords

CURRENT DENSITY; IMAGING TECHNIQUES; MAGNETIC MATERIALS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 33344455825     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2005.12.001     Document Type: Article
Times cited : (72)

References (22)
  • 19
    • 0012020872 scopus 로고    scopus 로고
    • National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, MD, USA
    • M.J. Donahue, D.G. Porter, NISTIR 6376, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, MD, USA, 1999; the current URL: http://math.nist.gov/oommf/
    • (1999) NISTIR 6376
    • Donahue, M.J.1    Porter, D.G.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.