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Volumn 54, Issue 6, 2006, Pages 1475-1486

Fatigue crack growth mechanisms at the microstructure scale in Al-Si-Mg cast alloys: Mechanisms in the near-threshold regime

Author keywords

Al Si Mg cast alloys; Closure; Long and small fatigue crack growth; Microstructure; Near threshold regime ( Kth Region I)

Indexed keywords

CRACK PROPAGATION; MAGNESIUM PRINTING PLATES; METAL CASTING; MICROSTRUCTURE; RESIDUAL STRESSES; SILICON;

EID: 33244480105     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2005.11.019     Document Type: Article
Times cited : (70)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.