A novel in situ synthesis and growth of ZnAl2O4 thin films

Journal of Crystal Growth

Volumn 289, Issue 1, 2006, Pages 405-407

  Kumar, K ^a   Ramamoorthy, K ^a   Koinkar, P M ^b   Chandramohan, R ^c   Sankaranarayanan, K ^a  

^a ALAGAPPA UNIVERSITY   (India)

^b UNIVERSITY OF PUNE   (India)

^c Sree Sevugan Annamalai College   (India)

Author keywords

A1. X ray diffraction; B1. Oxides; B2. Semiconducting ternary compounds

Indexed keywords

CRYSTAL GROWTH; MORPHOLOGY; OXIDES; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR MATERIALS; SYNTHESIS (CHEMICAL); THIN FILMS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

SEMICONDUCTING TERNARY COMPOUNDS; SPINEL OXIDE; SURFACE MORPHOLOGICAL PROPERTIES;

ZINC COMPOUNDS;

EID: 33244476706     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2005.11.007     Document Type: Article

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