Manufacturing of linear variable filters with straight iso-thickness lines

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5963, Issue , 2005, Pages

  Abel Tiberini, Laetitia ^a   Lemarquis, Frédéric ^a   Marchand, Gérard ^a   Roussel, Luc ^a   Albrand, Gérard ^a   Lequime, Michel ^a  

^a AIX MARSEILLE UNIVERSITÉ   (France)

Author keywords

Characterization; Linear variable filters; Optical coatings; Thickness uniformity

Indexed keywords

CHARACTERIZATION; OPTICAL COATINGS; OPTICAL MULTILAYERS; ROTATION; SPECTROMETERS; THICKNESS MEASUREMENT;

LINEAR VARIABLE FILTERS; THICKNESS UNIFORMITY;

OPTICAL FILTERS;

EID: 33144467132     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.624779     Document Type: Conference Paper

References (3)

1. Angela Piegari and Gabriele Emiliani "Laser mirrors with variable reflected intensity and uniform phase shift: design process" Applied optics Vol. 32, No. 28, 1 October 1993
2. L. Abel-Tiberini, F. Lemarquis, M. Lequime: "Dedicated spectrophotometer for localized transmittance and reflectance measurements", submitted to Applied Optics
3. A.Krasilnikova, A.Piegari, M.Dami, L. Abel-Tiberini, F.Lemarquis, M.Lequime: "Spatially resolved spectroscopy for non-uniform thin film coatings: comparison of two dedicated set-ups", SPIE, Optical Systems Design Jena, Sept 2005.