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2003 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC 2003

Volumn , Issue , 2003, Pages 383-386

Analysis of charge carrier multiplication events in NPT and PT-diodes triggered by an ionizing particle

(3) Kaindl, W a Solkner G b Wachutka, G a

a TECHNICAL UNIVERSITY OF MUNICH (Germany)

b INFINEON TECHNOLOGIES AG (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COSMIC RAYS; COSMOLOGY; DIODES; ELECTRIC FIELDS; ELECTRON DEVICES; ION BOMBARDMENT; RADIATION SHIELDING;

ACCUMULATED CHARGE; CARRIER MULTIPLICATION; CHARGE MULTIPLICATION; DISCRETE POWER DEVICES; IONIZING PARTICLES; IRRADIATION EXPERIMENTS; NON-PUNCH-THROUGH; TEMPORAL AND SPATIAL EVOLUTIONS;

SOLID STATE DEVICES;

EID: 33144466634 PISSN: None EISSN: None Source Type: Conference Proceeding
DOI: 10.1109/EDSSC.2003.1283555 Document Type: Conference Paper

Times cited : (9)

References (12)

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