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Volumn 52, Issue 6, 2005, Pages 2468-2474
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Complex upset mitigation applied to a re-configurable embedded processor
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Author keywords
Embedded processors; Field programmable gate arrays (FPGAs); Radiation testing
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Indexed keywords
EMBEDDED SYSTEMS;
FIELD PROGRAMMABLE GATE ARRAYS;
MICROPROCESSOR CHIPS;
SPACECRAFT;
EMBEDDED PROCESSORS;
IN-BEAM PERFORMANCE;
SPACECRAFT DESIGNERS;
TRIPLE MODULAR REDUNDANCY;
STATIC RANDOM ACCESS STORAGE;
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EID: 33144464077
PISSN: 00189499
EISSN: None
Source Type: Journal
DOI: 10.1109/TNS.2005.860743 Document Type: Conference Paper |
Times cited : (11)
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References (9)
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