Scanning tunnel microscopy and spectroscopy of an atomically clean bismuth surface

Physics-Uspekhi

Volumn 48, Issue 10, 2005, Pages 1057-1061

  Edel'man, V S ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC PROPERTIES; LATTICE CONSTANTS; SCANNING TUNNELING MICROSCOPY; SPECTROSCOPIC ANALYSIS;

FOREIGN ATOMS; TRIANGULAR LATTICE;

BISMUTH;

EID: 32944468272     PISSN: 10637869     EISSN: None     Source Type: Journal    
DOI: 10.1070/PU2005v048n10ABEH005797     Document Type: Conference Paper

References (18)

1. Edel'man V S Usp. Fiz. Nauk 123 257 (1977)
2. [Sov. Phys. Usp. 20 819 (1977)]
3. Lin Y, Allen R E Phys. Rev. B 52 1566 (1995)
4. Troyanovskii A M, Edelman V S Kristallografiya 44 336 (1999)
5. [Crystallogr. Rep. 44 300 (1999)]
6. Troyanovskii A M, Edel'man V S Pis'ma Zh. Eksp. Teor. Fiz. 60 104 (1994)
7. [JETP Lett. 60 111 (1994)]
8. Troyanovskii A M, Edel'man V S Pis 'ma Zh. Eksp. Teor. Fiz. 60 285 (1994)
9. [JETP Lett. 60 300 (1994)]
10. Khlyustikov I N, Edel'man V S Prib. Tekh. Eksp. (1) 158 (1996)
11. [Instrum. Exp. Tech. 39 143 (1996)]
12. Edel'man V S et al. J. Vac. Sci. Technol. 59618 (1991)
13. Klassen-Neklyudova M V Mekhanicheskoe Dvoinikovanie Kristallov (Mechanical Twinning of Crystals) (Moscow: Nauka, 1960) [Translated into English (New York: Consultants Bureau, 1964)]
14. Ofitserov A V, Edel'man V S Zh. Eksp. Teor. Fiz. 120 731 (2001)
15. [JETP 93 642 (2001)]
16. Jezequel G, Thomas J, Pollini I Phys. Rev. B 56 6620 (1997)
17. Edelman V S et al. Europhys. Lett. 34 (2) 115 (1996)
18. Edel'man V S Phys. Lett. A 210 105 (1996)