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Volumn 210, Issue 1-2, 1996, Pages 105-109
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STM observation of twin microlayers on cleaved bismuth surfaces
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Author keywords
[No Author keywords available]
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Indexed keywords
SCANNING TUNNELING MICROSCOPY;
ATOMIC ROWS;
ELECTRON PROPERTIES;
LOW TEMPERATURES;
MICROLAYERS;
BISMUTH;
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EID: 0009234514
PISSN: 03759601
EISSN: None
Source Type: Journal
DOI: 10.1016/0375-9601(95)00864-0 Document Type: Article |
Times cited : (16)
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References (8)
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