Sulfur K-edge XANES spectroscopy: Chemical state and content of sulfur in silicate glasses

Canadian Mineralogist

Volumn 43, Issue 5, 2005, Pages 1605-1618

  Fleet, Michael E ^a   Liu, Xiaoyang ^a   Harmer, Sarah L ^a,b   King, Penelope L ^a  

^a UNIVERSITY OF WESTERN ONTARIO   (Canada)

^b CSIRO   (Australia)

Author keywords

Basaltic glass; Chemical state of sulfur; X ray absorption near edge structure (XANES) spectroscopy

Indexed keywords

BASALTIC GLASS; ENERGY-SELECTIVE FLUORESCENCE DETECTOR; X-RAY ABSORPTION NEAR-EDGE STRUCTURE SPECTROSCOPY;

CRYSTALLINE MATERIALS; GEOCHEMISTRY; GLASS; QUENCHING; SILICATE MINERALS; SULFUR; SYNCHROTRON RADIATION; SYNTHESIS (CHEMICAL);

MINERALOGY;

CRYSTALLOGRAPHY; SILICATE; SULFUR; XANES SPECTROSCOPY;

EID: 32944457677     PISSN: 00084476     EISSN: None     Source Type: Journal    
DOI: 10.2113/gscanmin.43.5.1605     Document Type: Article

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