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Volumn 89, Issue 2, 2006, Pages 28-36

Measurements of longitudinal linewidth and relative intensity noise in ultrahigh-speed mode-locked semiconductor lasers

Author keywords

Intensity noise; Longitudinal linewidth; Mode locked semiconductor laser; Short pulse generation

Indexed keywords

FABRICATION; LIGHT SOURCES; OPTICAL COMMUNICATION; OPTICAL RESONATORS; OSCILLATIONS; SEMICONDUCTOR LASERS; SPURIOUS SIGNAL NOISE;

EID: 32944456953     PISSN: 8756663X     EISSN: None     Source Type: Journal    
DOI: 10.1002/ecjb.20185     Document Type: Article
Times cited : (5)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.