Secondary electron emission and surface charging evaluation of alumina ceramics and sapphire

IEEE Transactions on Dielectrics and Electrical Insulation

Volumn 13, Issue 1, 2006, Pages 72-77

  Suharyanto, ^a,c,d   Yamano, Yasushi ^a,e   Kobayashi, Shinichi ^a,d,e,f   Michizono, Shinichiro ^b,d,e,f   Saito, Yoshio ^b,e,f,g,h  

^a SAITAMA UNIVERSITY   (Japan)

^b HIGH ENERGY ACCELERATOR RESEARCH ORGANIZATION KEK   (Japan)

^c GADJAH MADA UNIVERSITY   (Indonesia)

^d Institute of Electrical Engineers of Japan   (Japan)

^e Vacuum Society of Japan   (Japan)

^f JAPAN SOCIETY OF APPLIED PHYSICS   (Japan)

^g IEEE

^h IEEE ^*  (Spain)

Author keywords

Alumina ceramic; Electron emission; High temperature measurement; Multipactor; rf window; Sapphire; Surface charging

Indexed keywords

SECONDARY ELECTRON EMISSION (SEE); SURFACE CHARGING; SURFACE HEATING;

ALUMINA; ELECTRIC CHARGE; ELECTRIC DISCHARGES; HEATING; HIGH TEMPERATURE EFFECTS; SAPPHIRE; SECONDARY EMISSION; SILICA;

CERAMIC MATERIALS;

EID: 32844468016     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/TDEI.2006.1593403     Document Type: Conference Paper

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