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Volumn 20, Issue 4, 2006, Pages 703-709

Structural analysis of secondary ions by post-source decay in time-of-flight secondary ion mass spectrometry

Author keywords

[No Author keywords available]

Indexed keywords

IONS; MAMMALS; SECONDARY EMISSION; SECONDARY ION MASS SPECTROMETRY;

EID: 32544432222     PISSN: 09514198     EISSN: 10970231     Source Type: Journal    
DOI: 10.1002/rcm.2362     Document Type: Article
Times cited : (29)

References (40)
  • 35
    • 85153542832 scopus 로고    scopus 로고
    • Available: http://www.OriginLab.com.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.