Macromodeling of digital I/O ports for system EMC assessment

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2002, Pages 1044-1048

  Stievano, I S ^a   Chen, Z ^b   Becker, D ^b   Canavero, F G ^a   Katopis, G ^b   Maio, I A ^a  

^a POLITECNICO DI TORINO   (Italy)

^b IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACCURACY LEVEL; BEHAVIORAL MODEL; DIGITAL I/O; INPUT AND OUTPUTS; MACROMODELING; MODELING PROCESS; PRACTICAL MODEL; SIGNAL INTEGRITY;

DIGITAL INTEGRATED CIRCUITS;

EXHIBITIONS;

EID: 32444440642     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2002.998429     Document Type: Conference Paper

References (10)

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