Behavioral models of digital IC ports from measured transient waveforms

IEEE Topical Meeting on Electrical Performance of Electronic Packaging

Volumn , Issue , 2000, Pages 211-214

  Stievano, I S ^a   Maio, I A ^a  

^a POLITECNICO DI TORINO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; MATHEMATICAL MODELS; WAVEFORM ANALYSIS;

NONLINEAR PARAMETRIC MODELS;

DIGITAL INTEGRATED CIRCUITS;

EID: 0034507813     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (4)