Fe/MgO interface engineering for high-output-voltage device applications

Applied Physics Letters

Volumn 88, Issue 6, 2006, Pages

  Tiusan, C ^a   Sicot, M ^a   Hehn, M ^a   Belouard, C ^a   Andrieu, S ^a   Montaigne, F ^a   Schuhl, A ^a  

^a CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH-OUTPUT-VOLTAGE DEVICE APPLICATIONS; TUNNEL JUNCTION OUTPUT VOLTAGE; TUNNEL MAGNETORESISTANCE;

CARBON; ELECTRIC POTENTIAL; IMPURITIES; IRON COMPOUNDS; MAGNETORESISTANCE; TUNNEL JUNCTIONS;

MAGNESIA;

EID: 32444434689     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2172717     Document Type: Article

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