Quantitative or semi-quantitative?-laboratory-based WD-XRF versus portable ED-XRF spectrometer: Results obtained from measurements on nickel-base alloys

X-Ray Spectrometry

Volumn 33, Issue 4, 2004, Pages 294-300

  Zwicky, Christoph N ^a   Lienemann, Peter ^a  

^a SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

DISPERSION (WAVES); ENERGY DISPERSIVE SPECTROSCOPY; NICKEL ALLOYS; X RAY SPECTROMETERS;

ANALYTICAL PROCEDURE; CERTIFIED REFERENCE MATERIALS; COUNTING STATISTICS; ENERGY DISPERSIVE X-RAY FLUORESCENCE; LINE INTERFERENCE; MATRIX CORRECTION; NICKEL BASE ALLOYS; PORTABLE ENERGY; WAVELENGTH-DISPERSIVE X-RAY FLUORESCENCES; X-RAY FLUORESCENCE SPECTROMETER;

FLUORESCENCE;

EID: 3242879368     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/xrs.730     Document Type: Conference Paper

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