Comparison of a compact energy-dispersive spectrometer with a wavelength-dispersive spectrometer for brass and stainless steel

X-Ray Spectrometry

Volumn 30, Issue 5, 2001, Pages 296-300

  Parus, Jozef ^a   Raab, Wolfgang ^b   Donohue, David L ^b  

^a INSTITUTE OF NUCLEAR CHEMISTRY AND TECHNOLOGY   (Poland)

^b INTERNATIONAL ATOMIC ENERGY AGENCY   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; DISPERSION (WAVES); IRON; SPECTROMETERS; STAINLESS STEEL; TIN;

ENERGY DISPERSIVE; ENERGY DISPERSIVE SPECTROMETERS; LIVE TIME; NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY; PHILIPS; REGRESSION EQUATION; RELATIVE STANDARDS DEVIATIONS; SPECTRA'S; STANDARD REFERENCE MATERIAL; WAVELENGTH DISPERSIVE SPECTROMETERS;

BRASS;

EID: 0035601657     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/xrs.501     Document Type: Article

References (2)

1. de Jongh WK. X-Ray Spectrom. 1973; 2: 151.
2. Tertian R, Claisse F. Principles of Quantitative X-Ray Fluorescence Analysis. Plenum Press: New York, 1982.