Near-tip stress fields and intensity factors for an interface crack in metal/piezoelectric bimaterials

International Journal of Engineering Science

Volumn 42, Issue 13-14, 2004, Pages 1407-1438

  Ou, Z C ^a   Chen, Y H ^a  

^a XI'AN JIAOTONG UNIVERSITY   (China)

Author keywords

Crack tip field; Generalized plane strain; Interface crack; Material mismatch; Metal; Piezoelectric material

Indexed keywords

ANISOTROPY; CRACK PROPAGATION; ELECTRIC FIELDS; ELECTRIC LOADS; ELECTRODES; MATHEMATICAL TRANSFORMATIONS; MULTILAYERS; OSCILLATIONS; PERMITTIVITY; SENSORS; STRESS INTENSITY FACTORS; TENSILE STRESS; TRANSDUCERS;

CRACK-TIP FIELDS; GENERALIZED PLANE STRAIN; INTERFACE CRACKS;

PIEZOELECTRIC MATERIALS;

EID: 3242723956     PISSN: 00207225     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijengsci.2004.01.008     Document Type: Article

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