Observation of fatigue crack growth in ferroelectrics under electrical loading

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4699, Issue , 2002, Pages 51-63

  Shieh, J ^a   Fleck, N A ^a   Huber, J E ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

Crack growth; Electric field; Electrical loading; Fatigue; Ferroelectrics; Test geometry

Indexed keywords

CERAMIC MATERIALS; CRACK PROPAGATION; ELECTRIC FIELD EFFECTS; ELECTRIC LOADS; FATIGUE OF MATERIALS; GRAIN SIZE AND SHAPE; STRESS CONCENTRATION;

WEDGING MECHANISMS;

FERROELECTRIC MATERIALS;

EID: 0036029588     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.475016     Document Type: Conference Paper

References (23)

1. A.J. Moulson, and J.M. Herbert, Electroceramics: Materials, Properties, and Applications, Chapman & Hall, London, 1990.
2. Y. Xu, Ferroelectric Materials and their Applications, North Holland, Amsterdam, 1991.
3. C.S. Lynch, L. Chen, W. Yang, Z. Suo, and R.M. McMeeking, "Crack growth in ferroelectric ceramics driven by cyclic polarization switching", J. of Intelligent Material Systems and Structures, 6(2), pp. 191-198, 1995.
4. C.S. Lynch, "Fracture of ferroelectric and relaxor electro-ceramics: influence of electric field", Acta Materialia, 46(2), pp. 599-608, 1998.
5. K. Okazaki, and T. Tanimoto, "Electro-mechanical strength and fatigue of ferroelectric ceramics", Ferroelectrics, 131, pp. 25-40, 1992.
6. 3", J. of the European Ceramic Society, 19, pp. 1299-1306, 1999.
7. H. Cao, and A.G. Evans, "Electric-field-induced fatigue crack growth in piezoelectrics", J. of the American Ceramic Society, 77(7), pp. 1783-1786, 1994.
8. T. Zhu, F. Fang, and W. Yang, "Fatigue crack growth in ferroelectric ceramics below the coercive field", J. of Materials Science Letters, 18, pp. 1025-1027, 1999.
9. H. Weitzing, G.A. Schneider, J. Steffens, M. Hammer, and M.J. Hoffmann, "Cyclic fatigue due to electric loading in ferroelectric ceramics", J. of the European Ceramic Society, 19, pp. 1333-1337, 1999.
10. J. Fan, H. Niu, and C.S. Lynch, "An experimental and theoreti cal study of electric field effects on cracked ceramics", J. of Materials Science Letters, 17, pp. 189-192, 1998.
11. S.B. Park, and C.T. Sun, "Effect of electric field on fracture of piezoelectric ceramics", Int. J. of Fracture, 70, pp. 203-216, 1995a.
12. S.B. Park, and C.T. Sun, "Fracture criteria for piezoelectric ceramics", J. of the American Ceramic Society, 78, pp. 1475-1480, 1995b.
13. R.M. McMeeking, "Crack tip energy release rate for a piezoelectric compact tension specimen", Engineering Fracture Mechanics, 64, pp. 217-244, 1999.
14. F. Fang, W. Yang, and T. Zhu, "Crack tip 90° domain switching in tetragonal lanthanum-modified lead zirconate titanate under an electric field", J. of Materials Research, 14(7), pp. 2940-2944, 1999.
15. W. Yang, F. Fang, and T. Zhu, "Microscopic deformation at a crack tip in a ferroelectric material", Key Engineering Materials, 183-187, pp. 175-180, 2000.
16. 3", Applied Physics Letters, 76(25), pp. 3732-3734, 2000.
17. J. Nuffer, D.C. Lupascu, and J. Rödel, "Damage evolution in ferroelectric PZT induced by bipolar electric cycling", Acta Materialia, 48, pp. 3783-3794, 2000.
18. X. Tan, and J.K. Shang, "Crack deflection in relaxor ferroelectric PLZT under inclined cyclic electric field", Scripta Materialia, 43, pp. 925-928, 2000.
19. J.K. Shang, and X. Tan, "A maximum strain criterion for electric-field-induced fatigue crack propagation in ferroelectric ceramics", Materials Science and Engineering, A301, pp. 131-139, 2001.
20. G.S. White, A.S. Raynes, M.D. Vaudin, and S.W. Freiman, "Fracture-behaviour of cyclically loaded PZT", J. of the American Ceramic Society, 77(10), pp. 2603-2608, 1994.
21. D.E. Dausch, "Ferroelectric polarization fatigue in PZT-based RAINBOWs and bulk ceramics", J. of the American Ceramic Society, 80(9), pp. 2355-2360, 1997.
22. R. Qian, S. Lukasiewicz, and Q. Gao, "Electrical fatigue response for ferroelectric ceramics under electrical cyclic load", Solid-State Electronics, 44, pp. 1717-1722, 2000.
23. 3", J. of Applied Physics, 88(12), pp. 7272-7277, 2000.