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Volumn 20, Issue 3, 2004, Pages 18-27

Beat the competition: A knowledge-based design process addressing the antenna effect and cell placement

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; ANTENNAS; APPLICATION SPECIFIC INTEGRATED CIRCUITS; CAPACITANCE; COMPUTER SIMULATION; ELECTRIC RESISTANCE; KNOWLEDGE BASED SYSTEMS; MATHEMATICAL MODELS; MOS DEVICES; PLASMA ETCHING; SEMICONDUCTOR DIODES; WSI CIRCUITS;

EID: 3242669723     PISSN: 87553996     EISSN: None     Source Type: Journal    
DOI: 10.1109/MCD.2004.1304538     Document Type: Article
Times cited : (6)

References (10)
  • 1
    • 84950124335 scopus 로고    scopus 로고
    • Fixing antenna problem by dynamic diode dropping jumper insertion
    • San Jose CA
    • P.H. Chen, S. Malkani, C.M. Peng, and J. Lin, "Fixing antenna problem by dynamic diode dropping and jumper insertion," in Proc. IEEE-ISQED, San Jose, CA, 2000, pp. 275-282.
    • (2000) Proc. IEEE-ISQED , pp. 275-282
    • Chen, P.H.1    Malkani, S.2    Peng, C.M.3    Lin, J.4
  • 2
    • 3242660476 scopus 로고    scopus 로고
    • Fixing antenna by synopsys SLE
    • San Jose CA Available
    • P.H. Chen, S. Malkani, C.M. Peng, and G. Ying, "Fixing antenna by synopsys SLE," in Proc. SNUG, San Jose, CA, 2000, vol. TA4, pp. 1-21. Available: http://www.snug.com
    • (2000) Proc. SNUG , vol.TA4 , pp. 1-21
    • Chen, P.H.1    Malkani, S.2    Peng, C.M.3    Ying, G.4
  • 3
    • 3242723701 scopus 로고    scopus 로고
    • A knowledge based design process addressing the antenna effect cell placement
    • San Jose CA Available
    • P.H. Chen and L. Reffelsen, "A knowledge based design process addressing the antenna effect and cell placement," in Proc. SNUG, San Jose, CA, 2001, vol. TB2, pp. 1-21. Available: http://www.snug.com
    • (2001) Proc. SNUG , vol.TB2 , pp. 1-21
    • Chen, P.H.1    Reffelsen, L.2
  • 5
    • 0014869120 scopus 로고
    • An r-dimensional quadratic placement algorithm
    • Nov
    • K.M. Hall, "An r-dimensional quadratic placement algorithm," Manage. Sci., vol. 17, no. 3, pp. 219-229, Nov. 1970.
    • (1970) Manage. Sci. , vol.17 , Issue.3 , pp. 219-229
    • Hall, K.M.1
  • 7
    • 0032266286 scopus 로고    scopus 로고
    • Relation between product yield plasma process induced damage
    • J.-M. Luchies, P. Simon, F. Kuper, and W. Maly, "Relation between product yield and plasma process induced damage," in Proc. P2ID Conf., 1998, pp. 7-10.
    • (1998) Proc. P2ID Conf. , pp. 7-10
    • Luchies, J.-M.1    Simon, P.2    Kuper, F.3    Maly, W.4
  • 8
    • 0024480849 scopus 로고
    • Simulated annealing algorithms: An overview
    • Jan
    • R.A. Rutenbar, "Simulated annealing algorithms: An overview." IEEE Circuits Devices Mag., vol. vol. 5, pp. 19-26, Jan. 1989.
    • (1989) IEEE Circuits Devices Mag. , vol.5 , pp. 19-26
    • Rutenbar, R.A.1
  • 9
    • 0027656150 scopus 로고
    • Plasma etching antenna effect on oxide silicon interface reliability
    • H.C. Shin and C. Hu, "Plasma etching antenna effect on oxide-silicon interface reliability," Solid State Electron., vol. 36, no. 9, pp. 1356-1358, 1993.
    • (1993) Solid State Electron , vol.36 , Issue.9 , pp. 1356-1358
    • Shin, H.C.1    Hu, C.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.