Isotopically pure 13C layer as a stress sensor in a diamond anvil cell

Applied Physics Letters

Volumn 84, Issue 26, 2004, Pages 5308-5310

  Qiu, Wei ^a   Velisavljevic, Nenad ^a   Baker, Paul A ^a   Vohra, Yogesh K ^a   Weir, Samuel T ^b  

^a UNIVERSITY OF ALABAMA AT BIRMINGHAM   (United States)

^b LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FULL WIDTH AT HALF MAXIMUM (FWHM); RAMAN SIGNALS; SINGLE WALL NANOTUBES (SWNT); STRESS SENSORS;

CARBON NANOTUBES; CHEMICAL POLISHING; CONVOLUTION; FLUORESCENCE; FREQUENCIES; HIGH PRESSURE EFFECTS; HYDROSTATIC PRESSURE; MICROWAVES; OXYGEN; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; SENSORS; SINGLE CRYSTALS; STRESS ANALYSIS;

DIAMONDS;

EID: 3242655671     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1766077     Document Type: Article

References (5)

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