Remote surface roughness scattering in ultrathin-oxide MOSFETs

European Solid-State Device Research Conference

Volumn , Issue , 2003, Pages 403-406

  Gamiz F ^a   Godoy, A ^a   Jimenez Molinos F ^a   Cartujo Cassinello, P ^a   Roldan J B ^a  

^a UNIVERSITY OF GRANADA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

MOSFETS; REMOTE SURFACES;

EID: 32344448854     PISSN: 19308876     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ESSDERC.2003.1256899     Document Type: Conference Paper

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