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Volumn 5948 II, Issue , 2005, Pages 1-6

Spectroscopic analysis technique for arc-welding process control

Author keywords

Arc welding; Plasma emission; Real time processing; Spectroscopy

Indexed keywords

INDUSTRIAL APPLICATIONS; LIGHT EMISSION; NONDESTRUCTIVE EXAMINATION; PLASMAS; PROCESS CONTROL; SPECTROSCOPIC ANALYSIS;

EID: 32144447996     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.621939     Document Type: Conference Paper
Times cited : (2)

References (7)
  • 1
    • 0030130074 scopus 로고    scopus 로고
    • Plasma charge sensor for in-process, non-contact monitoring of the laser welding process
    • L. Li, D. J. Brookfield, W M. Steen. "Plasma charge sensor for in-process, non-contact monitoring of the laser welding process", Meas. Sci. Tech. v 7, n 4, 1996, pp. 615-626.
    • (1996) Meas. Sci. Tech. , vol.7 , Issue.4 , pp. 615-626
    • Li, L.1    Brookfield, D.J.2    Steen, W.M.3
  • 2
    • 0030105091 scopus 로고    scopus 로고
    • Resonant acoustic emission during laser welding of metals
    • H. P. Gu, W. W. Duley. "Resonant acoustic emission during laser welding of metals". Journal of Physics D- Applied Physics, 29 (3) 1996, pp. 550-555.
    • (1996) Journal of Physics D- Applied Physics , vol.29 , Issue.3 , pp. 550-555
    • Gu, H.P.1    Duley, W.W.2
  • 4
    • 5544279079 scopus 로고    scopus 로고
    • Enhancement of detection accuracyof fiber Bragg grating sensors
    • Thomas Zeh, Hans Schweizer, Andreas Meixner. Andreas Purde, Alexander W. Koch, "Enhancement of detection accuracyof fiber Bragg grating sensors", Proceedings of SPIE, V 5502 (2004). pp. 540-543.
    • (2004) Proceedings of SPIE , vol.5502 , pp. 540-543
    • Zeh, T.1    Hans Schweizer, A.M.2    Purde, A.3    Koch, A.W.4
  • 5
    • 0032069442 scopus 로고    scopus 로고
    • High resolution instrumentation system for fibre-Bragg grating aerospace sensors
    • A. Ezbiri, S.E. Kanellopoulos, V.A. Handerek, "High resolution instrumentation system for fibre-Bragg grating aerospace sensors", Optics Communications, 150 (1998), pp. 43-48.
    • (1998) Optics Communications , vol.150 , pp. 43-48
    • Ezbiri, A.1    Kanellopoulos, S.E.2    Handerek, V.A.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.