Error analysis in the fitting of photoemission lineshapes using the Levenberg-Marquardt method

Journal of Electron Spectroscopy and Related Phenomena

Volumn 94, Issue 1-2, 1998, Pages 97-105

  Robinson, A W ^a   Gardner, P ^b   Stampfl, A P J ^c   Martin, R ^d,e   Nyberg, G ^c  

^a UNIVERSITY OF BIRMINGHAM   (United Kingdom)

^b UNIVERSITY OF MANCHESTER   (United Kingdom)

^c LA TROBE UNIVERSITY   (Australia)

^d FRITZ HABER INSTITUT DER MAX PLANCK GESELLSCHAFT   (Germany)

^e iRAS GmbH   (Germany)

Author keywords

Errors; Fitting; Levenberg Marquardt; Photoemission; Silicon

Indexed keywords

EID: 0009145514     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0368-2048(97)00107-2     Document Type: Article

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