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Volumn , Issue , 2005, Pages 1055-1062

Identification of elastic orthotropic material parameters based on ESPI measurements

Author keywords

[No Author keywords available]

Indexed keywords

FINITE ELEMENT METHOD; INTERFEROMETERS; LEAST SQUARES APPROXIMATIONS; NUMERICAL METHODS; STRAIN; TENSILE TESTING;

EID: 32044443157     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (20)

References (6)
  • 3
    • 0004282935 scopus 로고
    • John Wiley & Sons Ltd., New York
    • Gasvik, K.J., Optical metrology, John Wiley & Sons Ltd., New York, 1995
    • (1995) Optical Metrology
    • Gasvik, K.J.1
  • 4
    • 0030385898 scopus 로고    scopus 로고
    • An electronic speckle pattern interferometer for two-dimensional strain measurement
    • Moore, A.J., Lucas, M. and Tyrer J.R., An electronic speckle pattern interferometer for two-dimensional strain measurement, Measurement Science and Technology, 1740-1747, 1996
    • (1996) Measurement Science and Technology , pp. 1740-1747
    • Moore, A.J.1    Lucas, M.2    Tyrer, J.R.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.