An electronic speckle pattern interferometer for two-dimensional strain measurement

Measurement Science and Technology

Volumn 7, Issue 12, 1996, Pages 1740-1747

  Moore, Andrew J ^a   Lucas, Margaret ^b   Tyrer, John R ^b  

^a CENTRO DE INVESTIGACIONES EN ÓPTICA   (Mexico)

^b LOUGHBOROUGH UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

LASER APPLICATIONS; NUMERICAL METHODS; SPECKLE; STRAIN MEASUREMENT; SURFACE TENSION;

ELECTRONIC SPECKLE PATTERN INTERFEROMETER; TWO-DIMENSIONAL STRAIN MEASUREMENT;

INTERFEROMETERS;

EID: 0030385898     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/7/12/008     Document Type: Article

References (7)

1. Moore A J and Tyrer J R 1990 An electronic speckle pattern interferometer for complete in-plane displacement measurement Meas. Sci. Technol. 1 1024-30
2. Nakadate S and Saito H 1985 Fringe scanning speckle-pattern interferometry Appl. Opt. 24 2172-80
3. Kerr D, Mendoza Santoyo F and Tyrer J R 1989 Manipulation of the Fourier components of speckle fringe patterns as part of an interferometric analysis process J. Mod. Opt. 36 195-203
4. Timoshenko S P and Goodier J N 1970 Theory of Elasticity 3rd edn (London: McGraw-Hill) ch 5 and 22
5. O'Donnell W J 1960 The additional deflection of a cantilever due to the elasticity of the support J. Appl. Mech. 27 461-4.
6. Moore A J 1993 Strain analysis using ESPI applied to fracture mechanics PhD Thesis Loughborough University of Technology ch 4
7. Vrooman H A and Maas AAM 1989 Image processing in digital speckle interferometry Proc. 4th Int. Conf. of the Fringe Analysis Special Interest Group (FASIG), Loughborough Published without page numbers