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Volumn 365, Issue , 2001, Pages 835-844

Investigation of layer structure of MHPOBC free-standing film by transmission ellipsometry

Author keywords

Antiferroelectric liquid crystal; Ellipsometry; Free standing film

Indexed keywords


EID: 31944448632     PISSN: 1058725X     EISSN: None     Source Type: Journal    
DOI: 10.1080/10587250108025362     Document Type: Article
Times cited : (4)

References (6)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.