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Volumn 365, Issue , 2001, Pages 835-844
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Investigation of layer structure of MHPOBC free-standing film by transmission ellipsometry
a a a b |
Author keywords
Antiferroelectric liquid crystal; Ellipsometry; Free standing film
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Indexed keywords
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EID: 31944448632
PISSN: 1058725X
EISSN: None
Source Type: Journal
DOI: 10.1080/10587250108025362 Document Type: Article |
Times cited : (4)
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References (6)
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