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Volumn 38, Issue 11, 1999, Pages 6428-6432

Investigation of antiferroelectric liquid crystalline free-standing films by transmission ellipsometry

Author keywords

[No Author keywords available]

Indexed keywords

ELLIPSOMETRY; LIGHT POLARIZATION; LIGHT TRANSMISSION; PHASE MEASUREMENT; PHASE TRANSITIONS; THERMAL EFFECTS; THIN FILMS;

ANTIFERROELECTRIC LIQUID CRYSTALS; FREE-STANDING FILMS; TRANSMISSION ELLIPSOMETRY;

LIQUID CRYSTALS;

EID: 0033324472 PISSN: 00214922 EISSN: None Source Type: Journal
DOI: 10.1143/jjap.38.6428 Document Type: Article

Times cited : (9)

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