X-ray color scanner with multiple energy discrimination capability

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5922, Issue , 2005, Pages 1-8

  Tomita, Y ^a   Shirayanagi, Y ^a   Matsui, S ^a   Aoki, T ^b   Hatanaka, Y ^c  

^a CENTRAL RESEARCH LABORATORY   (Japan)

^b SHIZUOKA UNIVERSITY   (Japan)

^c AICHI UNIVERSITY OF TECHNOLOGY   (Japan)

Author keywords

Energy Discrimination; Energy Selective; Radiation Detector; Radiation Imaging; X ray Imaging

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; PHOTONS; SCANNING; SEMICONDUCTING CADMIUM TELLURIDE; SENSORS; THRESHOLD VOLTAGE;

ENERGY DISCRIMINATION; RADIATION IMAGING; X-RAY LINE SENSORS;

X RAY ANALYSIS;

EID: 31844452047     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.620025     Document Type: Conference Paper

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