Organic semiconductor structure and chemistry from Near-edge X-ray absorption fine structure (NEXAFS) spectroscopy

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5940, Issue , 2005, Pages 1-11

  DeLongchamp, Dean M ^a   Lin, Eric K ^a   Fischer, Daniel A ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Flexible electronics; NEXAFS; Organic semiconductors; Organic thin film transistor; P3HT; Pentacene; Poly(3 hexylthiophene); X ray absorption spectroscopy

Indexed keywords

SYNCHROTRONS; THIN FILM TRANSISTORS; X RAY SPECTROSCOPY;

FLEXIBLE ELECTRONICS; PENTACENE; THIN ORGANIC FILMS;

SEMICONDUCTING ORGANIC COMPOUNDS;

EID: 31744433040     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.616776     Document Type: Conference Paper

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