Gate induced leakage and drain current offset in organic thin film transistors

Organic Electronics

Volumn 7, Issue 1, 2006, Pages 16-21

  Jia, Huiping ^a   Pant, Gaurang K ^a   Gross, Erich K ^a   Wallace, Robert M ^a   Gnade, Bruce E ^a  

^a The University of Texas at Dallas   (United States)

Author keywords

Drain current offset; Gate induced leakage; Organic thin film patterning; Organic thin film transistor

Indexed keywords

DOPING (ADDITIVES); ELECTRODES; LEAKAGE CURRENTS; POLYMERS; SEMICONDUCTOR DEVICES; SULFUR COMPOUNDS;

DRAIN CURRENT OFFSETS; GATE INDUCED LEAKAGE; ORGANIC THIN FILM PATTERNING; ORGANIC THIN FILM TRANSISTORS;

THIN FILM TRANSISTORS;

EID: 31744431605     PISSN: 15661199     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.orgel.2005.10.003     Document Type: Article

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