Robust parameter design using generalized linear mixed models

Journal of Quality Technology

Volumn 38, Issue 1, 2006, Pages 65-75

  Robinson, Timothy J ^a,d,e   Wulff, Shaun S ^a,d   Montgomery, Douglas C ^b,d,e   Khuri, Andre I ^c,d  

^a UNIVERSITY OF WYOMING   (United States)

^b ARIZONA STATE UNIVERSITY   (United States)

^c UNIVERSITY OF FLORIDA   (United States)

^d Department of Statistics ^*  (United States)

^e ASQ   (United States)

Author keywords

Noise variables; Nonnormal; Random effects; Response surface methodology; Robust design

Indexed keywords

GAMMA RAYS; ROBUSTNESS (CONTROL SYSTEMS); SEMICONDUCTOR DEVICE MANUFACTURE;

NOISE VARIABLES; NON NORMAL; RANDOM EFFECTS; RESPONSE SURFACE METHODOLOGY; ROBUST DESIGN;

MATHEMATICAL MODELS;

EID: 31644438181     PISSN: 00224065     EISSN: None     Source Type: Journal    
DOI: 10.1080/00224065.2006.11918585     Document Type: Article

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