Joint estimation of location, dispersion, and random effects in robust design

Technometrics

Volumn 40, Issue 1, 1998, Pages 62-71

  Wolfinger, Russell D ^a   Tobias, Randall D ^a  

^a SAS INSTITUTE INC   (United States)

Author keywords

EBLUP; Log linear variance model; Mixed model; Noise variables; REML; Taguchi methods

Indexed keywords

ESTIMATION; FUNCTIONS; MATHEMATICAL MODELS; STATISTICAL METHODS;

ANALYSIS OF VARIANCE; DATASETS; LOG LINEAR VARIANCE MODEL; MAXIMUM LIKELIHOOD; MIXED MODEL; ROBUST DESIGN; TAGUCHI METHODS;

RANDOM NUMBER GENERATION;

EID: 0031999592     PISSN: 00401706     EISSN: 15372723     Source Type: Journal    
DOI: 10.1080/00401706.1998.10485482     Document Type: Article

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