Grain dependence of ferroelectric domain switching on SrBi 2Ta2O9 thin films observed by Kelvin probe force microscope

Thin Solid Films

Volumn 500, Issue 1-2, 2006, Pages 360-363

  Son, J Y ^a   Kim, Bog G ^a   Cho, J H ^a  

^a Pusan National University   (South Korea)

Author keywords

Ferroelectric domains; Kelvin probe force microscopy; Strontium bismuth tantalate; X ray diffraction

Indexed keywords

BISMUTH COMPOUNDS; FERROELECTRICITY; PROBES; PULSED LASER DEPOSITION; SCANNING ELECTRON MICROSCOPY; STRONTIUM COMPOUNDS; X RAY DIFFRACTION ANALYSIS;

FERROELECTRIC DOMAINS; GRAIN DEPENDENCE;

THIN FILMS;

EID: 31644433460     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2005.11.085     Document Type: Article

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