SCOPUS 정보 검색 플랫폼

Volumn 288, Issue 1, 2006, Pages 87-91

Dielectric functions of SiO2 film embedded with silicon nanocrystals

Author keywords

A2. Ion implantation; B1. Silicon nanocrystals (nc Si)

Indexed keywords

DIELECTRIC PROPERTIES OF SOLIDS; ELLIPSOMETRY; ION IMPLANTATION; MATHEMATICAL MODELS; NANOSTRUCTURED MATERIALS; SPECTROSCOPIC ANALYSIS; THIN FILMS;

DIELECTRIC FUNCTIONS; MAXWELL-GARNETT EFFECTIVE MEDIUM APPROXIMATION (EMA); SILICON NANOCRYSTALS (NC-SI); SPECTROSCOPIC ELLIPSOMETRY (SE);

SILICA;

EID: 31644433446 PISSN: 00220248 EISSN: None Source Type: Journal
DOI: 10.1016/j.jcrysgro.2005.12.040 Document Type: Conference Paper

Times cited : (5)

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