Carbon beads on semiconductor nanowires

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 44, Issue 9 A, 2005, Pages 6862-6863

  Kohno, Hideo ^a   Yoshida, Hideto ^a   Klkkawa, Jun ^a   Tanaka, Koji ^b   Takeda, Seiji ^a  

^a OSAKA UNIVERSITY   (Japan)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

Adhesion; Carbon beads; Contamination; Nanowire

Indexed keywords

ADHESION; ADHESIVES; CONTAMINATION; NANOSTRUCTURED MATERIALS; SEMICONDUCTOR MATERIALS; VISCOSITY;

CARBON BEADS; NANOWIRES;

CARBON;

EID: 31544466519     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.44.6862     Document Type: Article

References (5)

1. W. A. de Heer, P. Poncharal, C. Berger, J. Gezo, Z. Song, J. Bettini and D. Ugarte: Science 307 (2005) 907.
2. J. Kikkawa, Y. Ohno and S. Takeda: Appl. Phys. Lett. 86 (2005) 123109.
3. R. S. Wagner: Appl. Phys. Lett. 4 (1964) 89.
4. N. Ozaki, Y. Ohno and S. Takeda: Appl. Phys. Lett. 73 (1998) 3700.
5. R. Gupta, Q. Xiong, G. D. Mahan and P. C. Eklund: Nano Lett. 3 (2003) 1745.