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Volumn 44, Issue 12, 2005, Pages 8599-8605
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Microstructure and optical properties of Ba0.65Sr 0.35TiO3 thin films prepared by RF magnetron sputtering
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Author keywords
BST thin film; Envelope method; Microstructure; Optical properties; RF magnetron sputtering
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Indexed keywords
ANNEALING;
ATOMIC FORCE MICROSCOPY;
CRYSTALLIZATION;
MAGNETRON SPUTTERING;
MICROSTRUCTURE;
OPTICAL PROPERTIES;
REFRACTIVE INDEX;
SCANNING ELECTRON MICROSCOPY;
TEMPERATURE MEASUREMENT;
THIN FILMS;
X RAY DIFFRACTION;
BST THIN FILM;
ENVELOPE METHOD;
EXTINCTION COEFFICIENT;
RF MAGNETRON SPUTTERING;
BARIUM COMPOUNDS;
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EID: 31544448575
PISSN: 00214922
EISSN: 13474065
Source Type: Journal
DOI: 10.1143/JJAP.44.8599 Document Type: Article |
Times cited : (3)
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References (19)
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